Treatise on Materials Science and Technology, Volume 27: Analytical Techniques for Thin Films covers a set of analytical techniques developed for thin films and interfaces, all based on scattering and excitation phenomena and theories. The book discusses photon beam and X-ray techniques; electron beam techniques; and ion beam techniques. Materials scientists, materials engineers, chemical engineers, and physicists will find the book invaluable.
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|Size: ||61.0 MB|
|Publisher: ||Academic Press|
|Date published: || 1988|
|ISBN: ||9781483218311 (DRM-PDF)|
|Read Aloud: ||not allowed|