Treatise on Materials Science and Technology, Volume 19: Experimental Methods, Part A covers the methods of materials experimentation and testing. The book discusses the measurement of residual stresses by x-ray diffraction techniques; the investigation of composition variations by diffraction; and the use of MÃ¶ssbauer spectroscopy in materials science. The text also describes photoluminescence techniques for studies of composition and defects in semiconductors; and materials production by high-rate sputter deposition. Graduate students in the field of materials science, laboratory scientists, and materials engineers will find the book invaluable
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|Size: ||31.2 MB|
|Publisher: ||Academic Press|
|Date published: || 1980|
|ISBN: ||9781483218267 (DRM-PDF)|
|Read Aloud: ||not allowed|