Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation presents several methods to determine the reliability of infrared LEDs. The book focuses on the method to extract fundamental parameters from electrical and optical characterizations. The authors identify different parameters related to specific zones in components and then extract failure mechanisms based on measured performance-before and after aging tests. The knowledge of failure mechanisms allows you to extract degradation laws related to a physics equation so an accurate lifetime distribution can then be proposed.
- Deals exclusively with reliability, based on the physics of failure for infrared LEDs
- Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications
- Uses a complete methodology to reduce the number of samples needed to estimate lifetime distribution
- Focuses on the method to extract fundamental parameters from electrical and optical characterizations
To view this DRM protected ebook on your desktop or laptop you will need to have Adobe Digital Editions installed. It is a free software. We also strongly recommend that you sign up for an AdobeID at the Adobe website. For more details please see FAQ 1&2. To view this ebook on an iPhone, iPad or Android mobile device you will need the Adobe Digital Editions app, or BlueFire Reader or Txtr app. These are free, too. For more details see this article.
|Size: ||34.7 MB|
|Publisher: ||ISTE Press - Elsevier|
|Date published: || 2016|
|ISBN: ||2370007646692 (DRM-EPUB)|
|Read Aloud: ||not allowed|